Resonating techniques for the measurement of microwave surface impedance

被引：0

作者：

Kataria, ND ^{[1
]}

Misra, M ^{[1
]}

机构：

[1] Natl Phys Lab, Superconduct Div, New Delhi 110012, India

来源：

IETE JOURNAL OF RESEARCH | 1999年 / 45卷 / 3-4期

关键词：

microwave characterization; surface resistance; high temperature superconductor;

D O I：

10.1080/03772063.1999.11416099

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Since the discovery of HTS materials, various techniques have been used for microwave characterization spanning the frequency range from few MHz to >100 GHz and temperature ranging from few Kelvin to room temperature. In this paper, we shall discuss the established techniques based on resonating structures as well as the merits and demerits of these techniques.

引用

页码：219 / 224

页数：6

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