Gate voltage dependence of subband structure in a two-dimensional electron gas in AlGaN/GaN heterostructures

被引:4
|
作者
Tsubaki, K [1 ]
Maeda, N [1 ]
Saitoh, T [1 ]
Nishida, T [1 ]
Kobayashi, N [1 ]
机构
[1] NTT Corp, NTT Basic Res Labs, Atsugi, Kanagawa 2430198, Japan
来源
关键词
AlGaN; GaN; two-dimensional electron gas; subband; magnetoresistance;
D O I
10.1016/S1386-9477(02)00315-6
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
AlGaN/GaN heterostructure devices have recently been attracting much attention because of their potential for microwave applications. Therefore, the electronic properties of a two-dimensional electron gas (2DEG) in AlGaN/GaN heterostructures have recently been discussed. In this paper, we have studied the subbands of the 2DEG in AlGaN/GaN heterostructures by magnetoresistance measurements for the backgate voltages between 0 and -20 V up to 8 T. Since two kinds of periodic oscillations are observed, the existence of two subbands, the ground-subband and the first-excited-subband, is confirmed. The gate-voltage dependence of the electron concentration in each subband exhibits similar behaviour to the gate-voltage dependence of the electron concentration in AlGaAs/GaAs heterostructures. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:1111 / 1114
页数:4
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