Investigation of thermal stability of Cu/W multilayers by in-situ x-ray diffraction

被引：0

作者：

Cancellieri, Claudia ^{[1
]}

Moszner, Frank ^{[1
]}

Chiodi, Mirco ^{[1
]}

Yoon, Songhak ^{[1
]}

Ariosa, Daniel ^{[2
]}

Janczak-Rusch, Jolanta ^{[1
]}

Jeurgens, Lars ^{[1
]}

机构：

[1] Empa Swiss Fed Labs Mat Sci & Technol, Uberlandstr 129, CH-8600 Dubendorf, Switzerland

[2] Univ Republica, Inst Fis, Fac Ingn, Herrera & Reissig 565,CC 30, Montevideo 11000, Uruguay

来源：

ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2016年 / 72卷

关键词：

X-ray diffraction; Microstructure; Morphological stability;

D O I：

10.1107/S205327331609389X

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

MS43-P2

引用

页码：S418 / S418

页数：1

共 50 条

[21] IN-SITU X-RAY DIFFRACTION IMAGING OF POLYCRYSTALLINE MATERIALS
Wroblewski, T.
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1999, 55 : 63 - 63
[22] In-situ mechanical testing during X-ray diffraction
Van Swygenhoven, Helena
Van Petegem, Steven
MATERIALS CHARACTERIZATION, 2013, 78 : 47 - 59
[23] In situ X-ray Diffraction, DSC and Raman Spectroscopy Thermal Investigation of Chlorpropamide
Caetano, Marcia
Ayala, Alejandro P.
Mendes Filho, Josue
Faudone, S.
Sperandeo, N. R.
Cuffini, Silvia
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2005, 61 : C337 - C337
[24] Thermal Expansion of NANOPERM-type Alloys from In-situ X-ray Diffraction
Bednarcik, J.
Miglierini, M.
Curfs, C.
Franz, H.
MOSSBAUER SPECTROSCOPY IN MATERIALS SCIENCE - 2010, 2010, 1258 : 1 - +
[25] Microstructural characterisation of Co/Cu multilayers using X-ray diffraction
Kok, KY
Hall, MJ
Leake, JA
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 1996, 156 (1-3) : 51 - 52
[26] Phase stability of Heusler compound Co2FeSi under pressure: An in-situ x-ray diffraction investigation
Garg, Alka B.
Vijayakumar, V.
JOURNAL OF APPLIED PHYSICS, 2011, 110 (08)
[27] An in-situ, high-energy X-ray diffraction study of the thermal stability of delithiated LiVPO4F
Piao, Ying
Lin, Chi-kai
Qin, Yan
Zhou, Dehua
Ren, Yang
Bloom, Ira
Wei, Yingjin
Chen, Gang
Chen, Zonghai
JOURNAL OF POWER SOURCES, 2015, 273 : 1250 - 1255
[28] Thin layers and multilayers of porous silicon: x-ray diffraction investigation
Journal of Applied Physics, 1998, 83 (11 pt 1):
[29] Thin layers and multilayers of porous silicon: X-ray diffraction investigation
Buttard, D
Bellet, D
Dolino, G
Baumbach, T
JOURNAL OF APPLIED PHYSICS, 1998, 83 (11) : 5814 - 5822
[30] A combined in-situ X-ray spectroscopy/X-ray diffraction study of the mechanism of β-hematin formation
Harvey, I
Egan, TJ
JOURNAL OF INORGANIC BIOCHEMISTRY, 2001, 86 (01) : 252 - 252

← 1 2 3 4 5 →