Defect study on polyaniline by positron annihilation spectrometry

被引:5
|
作者
Nam, Ki Yong [1 ]
Jeon, Sang June [1 ]
Beack, Seung Hwa [2 ]
Joo, Koan Sik [1 ]
机构
[1] Myongji Univ, Dept Phys, Yongin, South Korea
[2] Myongji Univ, Dept Informat Engn, Yongin, South Korea
关键词
Positron annihilation lifetime spectroscopy; Scintillator detector; Fast coincidence system; Defect measurement;
D O I
10.1016/j.apradiso.2009.02.075
中图分类号
O61 [无机化学];
学科分类号
070301 ; 081704 ;
摘要
Fast coincidence system was constructed and applied to positron annihilation spectrometry (PAS). We studied on the factors that affected the time resolution of the system. Time resolutions were obtained and mutually compared with respect to several factors such as sizes, kinds of scintillators, length dependence of delay lines on the CFD583, and width variations of the windows for 511 keV and 1.27 MeV. Monoenergetic positron acceleration system was used to measure the lifetime components for the polyaniline, which have variable electric conductivity. We obtained 360-380ps as bulk lifetime for polyaniline, which intended to show that the higher the conductivity, the longer the bulk lifetime. The reasons were discussed in the context of the protonate H+. The defect in the sample was discussed in the relation of positron lifetime corresponding to the variation of conductivity. (c) 2009 Elsevier Ltd. All rights reserved.
引用
收藏
页码:1454 / 1457
页数:4
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