Imaging subsurface damage of grinded fused silica optics by confocal fluorescence microscopy

被引:100
|
作者
Neauport, J. [1 ]
Cormont, P. [1 ]
Legros, P. [2 ]
Ambard, C. [3 ]
Destribats, J. [1 ]
机构
[1] Ctr Etud Sci & Tech Aquitaine, Commissariat Energie Atom, F-23114 Le Barp, France
[2] Univ Bordeaux 2, Plate Forme Imagerie Cellulaire Inst Neurosci, Inst Francois Magendie, F-33076 Bordeaux, France
[3] Ctr Ripault, Commissariat Energie Atom, F-37260 Monts, France
来源
OPTICS EXPRESS | 2009年 / 17卷 / 05期
关键词
LASER-INDUCED DAMAGE; POLISHING-INDUCED CONTAMINATION; GOLD NANOPARTICLES; SURFACE-ROUGHNESS; 351; NM; BREAKDOWN; DENSITY; SITES;
D O I
10.1364/OE.17.003543
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We report an experimental investigation of fluorescence confocal microscopy as a tool to measure subsurface damage on grinded fused silica optics. Confocal fluorescence microscopy was performed with an excitation at the wavelength of 405 nm on fixed abrasive diamond grinded fused silica samples. We detail the measured fluorescence spectrums and compare them to those of oil based coolants and grinding slurries. We evidence that oil based coolant used in diamond grinding induces a fluorescence that marks the subsurface damages and eases its observation. Such residual traces might also be involved in the laser damage process. (C) 2009 Optical Society of America
引用
收藏
页码:3543 / 3554
页数:12
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