Standards of current and capacitance based on single-electron tunneling devices

被引：0
|
作者：
Keller, MW [1 ]
机构：
[1] Natl Inst Stand & Technol, Boulder, CO 80305 USA
来源：
RECENT ADVANCES IN METROLOGY AND FUNDAMENTAL CONSTANTS | 2001年 / 146卷
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D O I：
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中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
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页码：291 / 316
页数：26
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