An RF Approach to Modelling Gallium Nitride Power Devices Using Parasitic Extraction

被引:5
|
作者
Hari, Nikita [1 ]
Ramasamy, Sridhar [2 ]
Ahsan, Mominul [3 ]
Haider, Julfikar [3 ]
Rodrigues, Eduardo M. G. [4 ]
机构
[1] Univ Cambridge, Dept Engn, Ctr Photon & Elect, JJ Thomson Ave, Cambridge CB3 0FA, England
[2] SRM Inst Sci & Technol, Dept Elect & Elect Engn, Kattankulathur 603203, Tamil Nadu, India
[3] Manchester Metropolitan Univ, Dept Engn, John Dalton Bldg,Chester St, Manchester M1 5GD, Lancs, England
[4] Management & Prod Technol Northern Aveiro ESAN, Estr Cercal 449, P-3720509 Santiago De Riba Ul, Oliveira De Aze, Portugal
关键词
gallium nitride; power electronics; power device; parasitics; device modelling; switching model; Vector Network Analyser; GAN HEMTS; CAPACITANCES;
D O I
10.3390/electronics9122007
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
This paper begins with a comprehensive review into the existing GaN device models. Secondly, it identifies the need for a more accurate GaN switching model. A simple practical process based on radio frequency techniques using Vector Network Analyser is introduced in this paper as an original contribution. It was applied to extract the impedances of the GaN device to develop an efficient behavioural model. The switching behaviour of the model was validated using both simulation and real time double pulse test experiments at 500 V, 15 A conditions. The proposed model is much easier for power designers to handle, without the need for knowledge about the physics or geometry of the device. The proposed model for Transphorm GaN HEMT was found to be 95.2% more accurate when compared to the existing LT-Spice manufacturer model. This work additionally highlights the need to adopt established RF techniques into power electronics to reduce the learning curve while dealing with these novel high-speed switching devices.
引用
收藏
页码:1 / 19
页数:19
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