Temperature influence compensation in microbolometer detector for image quality enhancement

被引：0
|
作者：
Krupinski, M. [1 ]
Sosnowski, T. [1 ]
Madura, H. [1 ]
Gogler, S. [1 ]
机构：
[1] Mil Univ Technol, Gen Sylwestra Kaliskiego Str, PL-00908 Warsaw, Poland
来源：
13TH QUANTITATIVE INFRARED THERMOGRAPHY CONFERENCE | 2016年
关键词：
D O I：
10.21611/qirt.2016.068
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
In the article a non-uniformity correction method is presented which allows to compensate for the influence of detector's temperature drift. Presented method utilizes estimated dependency between output signal of detectors and their temperature. In the presented method, the dependency between output signal value and the temperature of the detector is estimated during time of starting detector. The coefficients are estimated for every pixel. Proposed method allows to compensate the influence of detectors temperature fluctuation and increase a time between shutter actuation process. Additional lenses coefficients allow to compensate ambient temperature fluctuation.
引用
收藏
页码：469 / 474
页数：6
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