Temperature influence compensation in microbolometer detector for image quality enhancement

In the article a non-uniformity correction method is presented which allows to compensate for the influence of detector's temperature drift. Presented method utilizes estimated dependency between output signal of detectors and their temperature. In the presented method, the dependency between output signal value and the temperature of the detector is estimated during time of starting detector. The coefficients are estimated for every pixel. Proposed method allows to compensate the influence of detectors temperature fluctuation and increase a time between shutter actuation process. Additional lenses coefficients allow to compensate ambient temperature fluctuation.