Tip size dependence of passive near-field microscopy

被引:34
|
作者
Lin, Kuan-Ting [1 ]
Komiyama, Susumu [2 ]
Kajihara, Yusuke [1 ]
机构
[1] Univ Tokyo, Inst Ind Sci, Meguro Ku, Komaba 4-6-1, Tokyo 1538505, Japan
[2] Univ Tokyo, Dept Basic Sci, Meguro Ku, Komaba 3-8-1, Tokyo 1538902, Japan
基金
日本学术振兴会; 日本科学技术振兴机构;
关键词
SCANNING-TUNNELING-MICROSCOPY; OPTICAL MICROSCOPY; SCATTERING; RADIATION;
D O I
10.1364/OL.41.000484
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We improve the spatial resolution and investigate the tip-sample coupling in a passive scattering-type scanning near-field optical microscope (s-SNOM), which probes thermally excited surface waves without any external light source. We study the spatial resolution, the intensity, and the decay behavior of the thermally excited near-field signals with different radii of curvatures of tungsten-tip apexes. We also study the tip size dependence of the interference pattern in the far-field region. The spatial resolution is closely related to the tip size, but the decay behavior of the near field is unrelated. These results suggest that the strength of the tip-sample coupling is unrelated to the tip size in the passive s-SNOM. We propose a theoretical model able to interpret the experimental data for the passive s-SNOM. (C) 2016 Optical Society of America
引用
收藏
页码:484 / 487
页数:4
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