Absolute calibration of an X-ray spectrometer on the NIST Electron-Beam Ion Trap: Control, design and systematics

被引：12
|
作者：
Paterson, D [1 ]
Chantler, CT [1 ]
Tran, CQ [1 ]
Hudson, LT [1 ]
Serpa, FG [1 ]
Deslattes, RD [1 ]
机构：
[1] NIST,ATOM PHYS DIV,GAITHERSBURG,MD 20899
来源：
PHYSICA SCRIPTA | 1997年 / T73卷
关键词：
D O I：
10.1088/0031-8949/1997/T73/133
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
The course of Electron-Beam Ion Trap (EBIT) experiments depends more and more on precision measurement. To design and test a system of absolute spectroscopy to 10-20 parts per million for such a source is a challenging task. Other design criteria include good efficiency in the 3-10keV energy range, ability to focus a line source and high vacuum compatibility. Some difficulties are discussed. The use of a non-scanning Johann focusing spectrometer and its consequent calibration is discussed The spectrometer has been used in a series of experiments on the NIST EBIT. The detector location is shown (both experimentally and by modelling) to provide a major systematic contribution, which can however be controlled to a suitable tolerance. Future directions are indicated.
引用
收藏
页码：400 / 402
页数：3
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