Reliability results of HBTs with an InGaP emitter (vol 46, pg 1261, 2006)

被引：0

作者：

Whitman, Charles S. ^{[1
]}

机构：

[1] RF Micro Devices, Greensboro, NC 27409 USA

来源：

MICROELECTRONICS RELIABILITY | 2006年 / 46卷 / 12期

关键词：

D O I：

10.1016/j.microrel.2006.08.015

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：2159 / 2159

页数：1

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