Frequency offset Raman spectroscopy (FORS) for depth probing of diffusive media

被引:26
|
作者
Sekar, Sanathana Konugolu Venkata [1 ]
Mosca, Sara [1 ]
Farina, Andrea [2 ]
Martelli, Fabrizio [3 ]
Taroni, Paola [1 ,2 ]
Valentini, Gianluca [1 ,2 ]
Cubeddu, Rinaldo [1 ]
Pifferi, Antonio [1 ,2 ]
机构
[1] Politecn Milan, Dipartimento Fis, Piazza Leonardo da Vinci 32, I-20133 Milan, Italy
[2] CNR, Ist Foton & Nanotecnol, Piazza Leonardo da Vinci 32, I-20133 Milan, Italy
[3] Univ Florence, Dipartimento Fis & Astron, Via G Sansone 1, I-50019 Florence, Italy
来源
OPTICS EXPRESS | 2017年 / 25卷 / 05期
关键词
SUBSURFACE ANALYSIS; PENETRATION DEPTH; LIGHT;
D O I
10.1364/OE.25.004585
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We present a new technique, frequency offset Raman spectroscopy (FORS), to probe Raman spectra of diffusive media in depth. The proposed methodology obtains depth sensitivity exploiting changes in optical properties (absorption and scattering) with excitation wavelengths. The approach was demonstrated experimentally on a two-layer tissue phantom and compared with the already consolidated spatially offset Raman spectroscopy (SORS) technique. FORS attains a similar enhancement of signal from deep layers as SORS, namely 2.81 against 2.62, while the combined hybrid FORS-SORS approach leads to a markedly higher 6.0 enhancement. Differences and analogies between FORS and SORS are discussed, suggesting FORS as an additional or complementary approach for probing heterogeneous media such as biological tissues in depth. (C) 2017 Optical Society of America
引用
收藏
页码:4585 / 4597
页数:13
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