Study of submicron deposits in polycrystalline materials using the internal-friction method

被引：5

作者：

Andreev, YN ^{[1
]}

Yaroslavtsev, NP ^{[1
]}

Bestaev, MV ^{[1
]}

Dimitrov, DT ^{[1
]}

Moshnikov, VA ^{[1
]}

Tairov, YM ^{[1
]}

机构：

[1] ST PETERSBURG STATE ELECT ENGN UNIV,ST PETERSBURG 197376,RUSSIA

来源：

SEMICONDUCTORS | 1997年 / 31卷 / 07期

关键词：

Dioxide; Magnetic Material; Internal Friction; Electromagnetism; Polycrystalline Sample;

D O I：

10.1134/1.1187074

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

An internal friction method is proposed for investigating the kinetics of impurity deposits on grain surfaces in polycrystalline samples. The possibilities of the method have been tested on polycrystalline, gas-sensitive, tellurium-doped layers of tin dioxide. (C) 1997 American Institute of Physics.

引用

页码：714 / 715

页数：2

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