Study of submicron deposits in polycrystalline materials using the internal-friction method

被引：5
|
作者：
Andreev, YN [1 ]
Yaroslavtsev, NP [1 ]
Bestaev, MV [1 ]
Dimitrov, DT [1 ]
Moshnikov, VA [1 ]
Tairov, YM [1 ]
机构：
[1] ST PETERSBURG STATE ELECT ENGN UNIV,ST PETERSBURG 197376,RUSSIA
来源：
SEMICONDUCTORS | 1997年 / 31卷 / 07期
关键词：
Dioxide; Magnetic Material; Internal Friction; Electromagnetism; Polycrystalline Sample;
D O I：
10.1134/1.1187074
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
An internal friction method is proposed for investigating the kinetics of impurity deposits on grain surfaces in polycrystalline samples. The possibilities of the method have been tested on polycrystalline, gas-sensitive, tellurium-doped layers of tin dioxide. (C) 1997 American Institute of Physics.
引用
收藏
页码：714 / 715
页数：2
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