Single InAs Nanowire Room-Temperature Near-Infrared Photodetectors

被引:254
|
作者
Miao, Jinshui [1 ,6 ]
Hu, Weida [1 ,6 ]
Guo, Nan [1 ,6 ]
Lu, Zhenyu [1 ,6 ]
Zou, Xuming [2 ,3 ]
Liao, Lei [2 ,3 ]
Shi, Suixing [1 ,6 ]
Chen, Pingping [1 ,6 ]
Fan, Zhiyong [4 ]
Ho, Johnny C. [5 ]
Li, Tian-Xin [1 ,6 ]
Chen, Xiao Shuang [1 ,6 ]
Lu, Wei [1 ,6 ]
机构
[1] Chinese Acad Sci, Shanghai Inst Tech Phys, Natl Lab Infrared Phys, Shanghai 200083, Peoples R China
[2] Wuhan Univ, Dept Phys, Wuhan 430072, Peoples R China
[3] Wuhan Univ, Key Lab Artificial Micro & Nanostruct, Minist Educ, Wuhan 430072, Peoples R China
[4] Hong Kong Univ Sci & Technol, Dept Elect & Comp Engn, Hong Kong, Hong Kong, Peoples R China
[5] City Univ Hong Kong, Dept Phys & Mat Sci, Hong Kong, Hong Kong, Peoples R China
[6] Univ Sci & Technol China, Synerget Innovat Ctr Quantum Informat & Quantum P, Hefei 230026, Anhui, Peoples R China
基金
中国国家自然科学基金;
关键词
InAs nanowire; infrared photodetectors; half-wrapped top-gate; photoresponsivity; surface defect states; FIELD-EFFECT TRANSISTORS; SURFACE PASSIVATION; ELECTRON-MOBILITY; TRANSPORT-PROPERTIES; PERFORMANCE; LEVEL; HETEROSTRUCTURES; DEVICES; NOISE; LAYER;
D O I
10.1021/nn500201g
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Here we report InAs nanowire (NW) near-infrared photodetectors having a detection wavelength up to similar to 1.5 mu m. The single InAs NW photodetectors displayed minimum hysteresis with a high I-on/I-off ratio of 10(5). At room temperature, the Schottky-Ohmic contacted photodetectors had an external photoresponsivity of similar to 5.3 x 10(3) AW(-1), which is similar to 300% larger than that of Ohmic-Ohmic contacted detectors (similar to 1.9 x 10(3) AW(-1)). A large enhancement in photoresponsivity (similar to 300%) had also been achieved in metal Au-cluster-decorated InAs NW photodetectors due to the formation of Schottky junctions at the InAs/Au duster contacts. The photocurrent decreased when the photodetectors were exposed to ambient atmosphere because of the high surface electron concentration and rich surface defect states In InAs NWs. A theoretical model based on charge transfer and energy band change is proposed to explain this observed performance. To suppress the negative effects of surface defect states and atmospheric molecules, new InAs NW photodetectors with a half-wrapped top-gate had been fabricated by using 10 nm HfO2 as the top-gate dielectric.
引用
收藏
页码:3628 / 3635
页数:8
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