Acoustic near field microscopy of polycrystalline materials

被引:0
|
作者
Liu, X
Zhang, BY
Yin, QR
Balk, LJ
机构
[1] ACAD SINICA,SHANGHAI INST CERAM,SHANGHAI 200050,PEOPLES R CHINA
[2] BERG UNIV GESAMTHSCH WUPPERTAL,FACHBEREICH ELEKTROTECH,D-42097 WUPPERTAL,GERMANY
关键词
D O I
暂无
中图分类号
Q2 [细胞生物学];
学科分类号
071009 ; 090102 ;
摘要
引用
收藏
页码:13 / 13
页数:1
相关论文
共 50 条
  • [41] NEAR-FIELD MICROSCOPY AND NEAR-FIELD OPTICS
    COURJON, D
    BAINIER, C
    REPORTS ON PROGRESS IN PHYSICS, 1994, 57 (10) : 989 - 1028
  • [42] Acoustic microscopy signal processing method for detecting near-surface defects in metal materials
    Li, Min
    Li, Xue
    Gao, Chenxing
    Song, Yanan
    NDT & E INTERNATIONAL, 2019, 103 : 130 - 144
  • [43] SCANNING ACOUSTIC MICROSCOPY OF PARTLY EMBEDDED CRACKS IN POLYCRYSTALLINE ALUMINA
    SMITH, GC
    ALMOND, EA
    GEE, MG
    NIKOONAHAD, M
    PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1986, 320 (1554): : 237 - +
  • [44] Acoustic nonlinearity parameters for transversely isotropic polycrystalline materials
    Kube, Christopher M.
    Turner, Joseph A.
    JOURNAL OF THE ACOUSTICAL SOCIETY OF AMERICA, 2015, 137 (06): : 3272 - 3280
  • [45] Acoustic nonlinearity parameters for transversely isotropic polycrystalline materials
    Kube, Christopher M., 1600, Acoustical Society of America (137):
  • [46] Instrumentation-level improvements in shear-force near-field acoustic microscopy
    Bai, J.
    Devulapalli, P.
    Brockman, T.
    La Rosa, Andres H.
    XVI MEETING OF PHYSICS, 2018, 1143
  • [47] Contactless topography and microhardness measurements using scanning near-field acoustic microscopy (SNAM)
    Goch, G
    Lehmann, P
    PRECISION ENGINEERING, NANOTECHNOLOGY, VOL. 2, 1999, : 479 - 482
  • [48] Integration of Scanning Near Field Polarization Optical Microscopy and Atomic Force Microscopy for Investigation of Magnetic and Ferroelectric Materials
    Vysokikh, Yury
    Shevyakov, Vasiliy
    Shaposhnikov, Alexandr
    Prokopov, Anatoliy
    Shelaev, Artem
    PROCEEDINGS OF THE 2017 IEEE RUSSIA SECTION YOUNG RESEARCHERS IN ELECTRICAL AND ELECTRONIC ENGINEERING CONFERENCE (2017 ELCONRUS), 2017, : 1445 - 1448
  • [49] Near-field scanning optical microscopy studies of electronic and photonic materials and devices
    Hsu, JWP
    MATERIALS SCIENCE & ENGINEERING R-REPORTS, 2001, 33 (01): : 1 - 50
  • [50] Polarization-modulation near-field scanning optical microscopy of mesostructured materials
    Higgins, DA
    VandenBout, DA
    Kerimo, J
    Barbara, PF
    JOURNAL OF PHYSICAL CHEMISTRY, 1996, 100 (32): : 13794 - 13803