Band alignments in InxGa1-xP/GaAs heterostructures investigated by pressure experiments

被引:0
|
作者
Martínez-Pastor, J
Camacho, J
Rudamas, C
Cantarero, A
González, L
Syassen, K
机构
[1] Univ Valencia, Inst Ciencia Mat, E-46071 Valencia, Spain
[2] PTM, CSIC, CNM, Inst Microelect Madrid, E-28760 Tres Cantos, Madrid, Spain
[3] Max Planck Inst Festkorperforsch, D-70569 Stuttgart, Germany
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关键词
D O I
10.1002/1521-396X(200003)178:1<571::AID-PSSA571>3.0.CO;2-M
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
InxGa1-xP/GaAs (x = 0.541 and 0.427) heterostructures, grown by Atomic Layer Molecular Beam Epitaxy (ALMBE) on low temperature substrates, have been characterised by pressure-dependent and time-resolved photoluminescence experiments. The excitonic optical transitions and recombination dynamics are both influenced by the particular band alignments of these systems. The valence band offset has been found to have approximately the same absolute value (Delta E-VB approximate to 380 meV), independent of the In content of the alloy in the barrier, whereas the conduction band offset varies appreciably depending on the alloy band gap. The huge valence band offset implies a strong asymmetry in the confinement of carriers, affecting the exciton recombination dynamics in the quantum wells.
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页码:571 / 576
页数:6
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