MBE growth and digital etch of GaSb/InAs nanowires on Si for logic applications

被引:4
|
作者
Dropiewski, Katherine [1 ]
Tokranov, Vadim [1 ]
Yakimov, Michael [1 ]
Oktyabrsky, Serge [1 ]
Bentley, Steven [2 ]
Galatage, Rohit [2 ]
机构
[1] SUNY Polytech Inst, 257 Fuller Rd, Albany, NY 12203 USA
[2] GLOBALFOUNDRIES, Albany NanoTech Campus,257 Fuller Rd, Albany, NY 12203 USA
来源
关键词
FIELD-EFFECT TRANSISTORS; INAS; SILICON; SEMICONDUCTORS; MOBILITY; EPITAXY; GAAS;
D O I
10.1116/1.4978782
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The 6.1 angstrom III-V "high-mobility" semiconductor family includes materials with beneficial transport properties of both electrons and holes (InAs, GaSb), which are appealing for fast and low-power complementary metal-oxide-semiconductor applications. Yet their large lattice mismatch with Si (similar to 12%) results in three dimensional island nucleation and therefore growth defects. The solution for deposition of this high mismatch material is the growth of the entire device from a single nucleus, such as in vertical nanowires. Two types of GaSb nanowires (NWs) are demonstrated on a Si(111) substrate: vertically stacked InAs/GaSb NWs and coaxial core/shell NWs. This paper summarizes surface preparation, growth conditions, and postprocessing steps which can be used to create nanowires with small enough diameters for use as logic devices. (C) 2017 American Vacuum Society.
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页数:6
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