SiO2-ZrO2 sol-gel nanostructured thin films with optical properties

被引：0
|
作者：
Crisan, M
Gartner, M
Predoana, L
Crisan, D
Scurtu, R
Gavrila, R
Zaharescu, M
机构：
[1] Roumanian Acad, Inst Phys Chem IG Murgulescu, Bucharest 77208, Romania
[2] Natl Inst Res & Dev Microtechnol, Bucharest 72225, Romania
来源：
EURO CERAMICS VIII, PTS 1-3 | 2004年 / 264-268卷
关键词：
sol-gel method; alkoxide route; SiO2-ZrO2; films; optical and structural characterization;
D O I：
暂无
中图分类号：
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
SiO2-ZrO2 based nanometric multilayers films have been prepared by sol-gel method from metallorganic precursors by low temperature polymerization reactions. Simultaneous gelation of both cations was realized. Homogeneous and transparent films were poduced on glass Substrate at room temperature by dipping procedure. Each deposited layer was thermal treated 1h at 300degreesC. The coatings were characterized by XRD, spectroellipsometry (SE), UV-VIS spectroscopy and AFM method. The influence of number of coatings and thermal treatments on the optical and structural proprieties of the films was established.
引用
收藏
页码：553 / 556
页数：4
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