Special issue on measurement, modeling, and design for nonlinear microwave circuits

被引：0

|

作者：

Beyer, A

Nauwelaers, BR

Schreurs, D

机构：

来源：

INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING | 2002年 / 12卷 / 05期

关键词：

D O I：

10.1002/mmce.10046

中图分类号：

TP39 [计算机的应用];

学科分类号：

081203 ; 0835 ;

摘要：

引用

收藏

页码：386 / 387

页数：2

相关论文

共 50 条

[31] SPECIAL ISSUE ON OPTICAL MICROWAVE INTERACTION DEVICES, CIRCUITS AND SYSTEMS - FOREWORD
YONEYAMA, T
OGAWA, H
IEICE TRANSACTIONS ON ELECTRONICS, 1993, E76 (02) : 173 - 174
[32] SPECIAL ISSUE PAPERS ON MONOLITHIC MICROWAVE INTEGRATED-CIRCUITS - FOREWORD
AYASLI, Y
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1986, 33 (12) : 2046 - 2046
[33] Foreword - Special issue on low Distortion technology for microwave devices and circuits
Itoh, Y
Kuzuhara, M
IEICE TRANSACTIONS ON ELECTRONICS, 1999, E82C (05) : 677 - 678
[34] SPECIAL ISSUE ON APPLICATIONS OF LIGHTWAVE TECHNOLOGY TO MICROWAVE DEVICES, CIRCUITS, AND SYSTEMS
HERCZFELD, PR
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1990, 38 (05) : 465 - 466
[35] Computer-aided design of nonlinear microwave circuits
Wolff, I
Beyer, A
INTERNATIONAL JOURNAL OF MICROWAVE AND MILLIMETER-WAVE COMPUTER-AIDED ENGINEERING, 1996, 6 (04): : 218 - 218
[36] SPECIAL ISSUE ON DIRECTIONS IN DESIGN AND APPLICATIONS OF MICROWAVE SYSTEMS
HEITER, GL
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1991, 39 (05) : 753 - 754
[37] MINI-SPECIAL ISSUE ON 2014 INTERNATIONAL WORKSHOP ON INTEGRATED NONLINEAR MICROWAVE AND MILLIMETRE-WAVE CIRCUITS (INMMiC)
Crupi, Giovanni
Raffo, Antonio
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2014, 62 (11) : 2497 - 2498
[38] MEASUREMENT OF MICROWAVE MONOLITHIC CIRCUITS AS THE BASIS OF A GOOD DESIGN
OUVRARD, PL
ANNALES DES TELECOMMUNICATIONS-ANNALS OF TELECOMMUNICATIONS, 1988, 43 (5-6): : 341 - 346
[39] Scanning the issue - Special issue on modeling and design of embedded software
Sastry, S
Sztipanovits, J
Bajcsy, R
Gill, H
PROCEEDINGS OF THE IEEE, 2003, 91 (01) : 3 - 10
[40] Special Issue on Design, Technology, and Test of Integrated Circuits and Systems
Bosio, Alberto
Barbareschi, Mario
JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS, 2019, 28

← 1 2 3 4 5 →