Band offsets in c-Si/Si-XII heterojunctions

被引:0
|
作者
Mustafa, Jamal I. [1 ,2 ]
Malone, Brad D. [1 ,2 ,3 ]
Cohen, Marvin L. [1 ,2 ]
Louie, Steven G. [1 ,2 ]
机构
[1] Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA
[2] Univ Calif Berkeley, Lawrence Berkeley Natl Lab, Div Mat Sci, Berkeley, CA 94720 USA
[3] Harvard Univ, Sch Engn & Appl Sci, Cambridge, MA 02138 USA
基金
美国国家科学基金会;
关键词
Semiconductors; Electronic band structure; Electronic transport; SCHOTTKY-BARRIER HEIGHTS; HIGH-PRESSURE PHASE; METASTABLE PHASES; QUASI-PARTICLE; SILICON; TRANSITIONS; GE; SI;
D O I
10.1016/j.ssc.2014.04.011
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Silicon has a rich phase diagram with a multitude of phases existing over a wide range of pressures and temperatures, in addition to the common cubic silicon (c-Si) phase. One such phase, Si-XII, was first observed less than 2 decades ago in diamond anvil experiments, and more recently as a product of nanoindentation. In some of these latter experiments, I-V measurements were performed to characterize the c-Si/Si-XII interface that results when Si-XII is formed in cubic silicon substrates. In this paper we describe calculations of the band offsets in c-Si/Si-XII heterojunctions. We find that the heterojunction is of Type I and that the band offsets are estimated to be Delta E-v = 0.3 eV and Delta E-c = 0.5 eV for the valence bands and conduction bands, respectively. (C) 2014 Elsevier Ltd. All rights reserved.
引用
收藏
页码:6 / 9
页数:4
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