Apparatus for X-ray diffraction analysis at high pressures

被引：3
|
作者：
Novikov, NV [1 ]
Shvedov, LK [1 ]
Dobrovolsky, VD [1 ]
Krivosheya, YN [1 ]
Radchenko, OG [1 ]
机构：
[1] NAS Ukraine, Inst Superhard Mat, UA-04074 Kiev, Ukraine
来源：
RADIATION PHYSICS AND CHEMISTRY | 2004年 / 71卷 / 3-4期
关键词：
D O I：
10.1016/j.radphyschem.2004.04.085
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：741 / 742
页数：2
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