Formation of SiC layer by carbonization of Si surface using CO gas

被引:5
|
作者
Deura, Momoko [1 ]
Fukuyama, Hiroyuki [2 ]
机构
[1] Tohoku Univ, Inst Mat Res, Aoba Ku, Sendai, Miyagi 9808577, Japan
[2] Tohoku Univ, Inst Multidisciplinary Res Adv Mat, Aoba Ku, Sendai, Miyagi 9808577, Japan
关键词
Phase diagrams; Surface processes; Semiconducting silicon compounds; (111)SI SUBSTRATE; GROWTH; NITRIDE; QUALITY; SI(111); FILM;
D O I
10.1016/j.jcrysgro.2015.10.030
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Carbonization of Si surfaces was performed using C-saturated CO gas. The experimental conditions were determined by considering the phase stability diagram for the SiC-SiO2-CO system constructed using thermodynamic data. Annealing Si substrates under the SiC-stable condition led to the formation of SiC over the entire surfaces of Si(100), Si(110), and Si(111) substrates. During carbonization, SiC nuclei first form on the Si surface. These nuclei advances grow through the surface diffusion of Si atoms, which leads to poor in-plane uniformity of the amount of SiC and the formation of numerous voids in a similar manner to that observed for other C sources. (C) 2015 Elsevier B.V. All rights reserved.
引用
收藏
页码:77 / 80
页数:4
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