Carrier dynamics and optical nonlinearities in a GaN epitaxial thin film under three-photon absorption

被引:10
|
作者
Martins, R. J. [1 ]
Siqueira, J. P. [1 ]
Clavero, I. Manglano [2 ]
Margenfeld, C. [2 ]
Fuendling, S. [2 ]
Vogt, A. [2 ]
Waag, A. [2 ]
Voss, T. [2 ]
Mendonca, C. R. [1 ]
机构
[1] Univ Sao Paulo, Inst Fis Sao Carlos, Caixa Postal 369, BR-13560970 Sao Carlos, SP, Brazil
[2] Braunschweig Univ Technol, Inst Semicond Technol, Braunschweig, Germany
基金
巴西圣保罗研究基金会;
关键词
LIGHT-EMITTING-DIODES; CHEMICAL-VAPOR-DEPOSITION; MG-DOPED GAN; YELLOW LUMINESCENCE; 2-PHOTON ABSORPTION; BUFFER LAYER; BAND-GAP; GROWTH; PHOTOLUMINESCENCE; EXCITATION;
D O I
10.1063/1.5027395
中图分类号
O59 [应用物理学];
学科分类号
摘要
We studied the near-band-edge emission (NBE) and yellow defect luminescence (YL) of GaN under below bandgap excitation with 40-fs laser pulses at a wavelength of 775 nm. Even though in this case three-photon absorption processes are required for the excitation of band-to-band transitions, fourth-order (I-NBE proportional to I-exc(4)) and sub-linear (I-YL proportional to I-exc(0.5)) dependencies were observed for the intensity of the NBE and YL as a function of the excitation intensity, respectively. Modelling the carrier dynamics with a few-level rate-equation model revealed that, for high excitation irradiances, the electron-hole population generated by three-photon absorption is such that the NBE recombination rate is intensified (exponent > 3) and, at the same time, the competition between the electron capturing and the defect-level emission rate suppresses the YL (exponent < 1). Published by AIP Publishing.
引用
收藏
页数:5
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