Phase-Resolved Observation of the Gouy Phase Shift of Surface Plasmon Polaritons

被引：11

作者：

Birr, Tobias ^{[1
]}

Fischer, Tim ^{[1
]}

Evlyukhin, Andrey B. ^{[1
]}

Zywietz, Urs ^{[1
]}

Chichkov, Boris N. ^{[1
]}

Reinhardt, Carsten ^{[1
,2
]}

机构：

[1] Laser Zentrum Hannover eV, Hollerithallee 8, D-30419 Hannover, Germany

[2] Hsch Bremen, Neustadtswall 30, D-28199 Bremen, Germany

来源：

ACS PHOTONICS | 2017年 / 4卷 / 04期

关键词：

Gouy phase shift; surface plasmon-polaritons; leakage radiation microscopy; PULSES;

D O I：

10.1021/acsphotonics.6b00999

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The space-resolved Gouy phase shift for focused surface plasmon polaritons (SPPs) in the optical regime is experimentally demonstrated for the first time. SPPs are excited by CW laser radiation focused onto a dielectric ridge placed on a cover glass surface coated by a silver film. The Gouy phase measurements are performed using interference between a reference plane wave and leakage radiation. The measured Gouy shift has a value of pi/2 corresponding to the two-dimensional nature of surface plasmon polaritons.

引用

页码：905 / 908

页数：4

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