Invariant ridgelet-Fourier descriptor for pattern recognition

被引：0
|
作者：
Chen, G. Y. [1 ]
Bui, T. D. [1 ]
Krzyzak, A. [1 ]
机构：
[1] Concordia Univ, Dept Comp Sci, 1455 De Maisonneuve W, Montreal, PQ H3G 1M8, Canada
来源：
18TH INTERNATIONAL CONFERENCE ON PATTERN RECOGNITION, VOL 2, PROCEEDINGS | 2006年
关键词：
D O I：
暂无
中图分类号：
TP18 [人工智能理论];
学科分类号：
081104 ; 0812 ; 0835 ; 1405 ;
摘要：
In this paper, we present a novel descriptor for feature extraction by using a combination of ridgelets and Fourier transform. We have successfully implemented ridgelets on the circular disk containing the pattern and applied Fourier transform on the resulting ridgelet coefficients to extract rotation-invariant features for pattern recognition. The descriptor is very robust to Gaussian noise even when the noise level is high. Experimental results show that the new descriptor is a very good choice for pattern recognition.
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页码：768 / +
页数：2
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