Testing for the validity of the assumptions in the exponential step-stress accelerated life-testing model

被引:17
|
作者
Wang, Bing Xing [1 ]
机构
[1] Zhejiang Gongshang Univ, Hangzhou, Zhejiang, Peoples R China
关键词
FAILURE RATE MODEL;
D O I
10.1016/j.csda.2009.01.008
中图分类号
TP39 [计算机的应用];
学科分类号
081203 ; 0835 ;
摘要
In the application of the exponential step-stress accelerated life-testing model, there are usually three assumptions required: (1) for any stress level, the lifetime distribution of a test unit is exponential; (2) for any stress level, the mean life of a test unit is a log-linear function of stress; (3) a cumulative exposure model holds. This paper explores the validity of assumptions 1 and 3. It is proved that assumption 3 is unnecessary to the exponential step-stress accelerated life-testing model. A test statistic is proposed to test the validity of the assumptions 1. The null distribution of the test statistic is derived. A Monte Carlo simulation is given to study the power of the proposed test procedure. Finally, an example is given to illustrate the proposed test procedure. (C) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码:2702 / 2709
页数:8
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