An accurate and simplified small signal parameter extraction method for GaN HEMT

In this paper, development of a small signal model for 2 x 200 mu m GaN HEMT based on the conventional 20-element model is presented. The proposed model presents a direct parameter extraction algorithm, instead of the hybrid optimization approach, that provides simplification, accuracy, and less computational complexity. The extrinsic elements are extracted using a modified cold pinch-off condition while discarding the unwanted forward biasing of the gate. The negative drain to source capacitance C-ds is also observed in the ohmic region (for smaller V-DS). An excellent agreement found between the measured and modeled data for a wide range of frequencies and bias values shows the effectiveness of the proposed approach. The proposed modeling technique is validated with a good agreement between the achieved bias dependency of intrinsic parameter values and the respective theoretical parameter values.