Improvement of Swanepoel method for deriving the thickness and the optical properties of chalcogenide thin films

被引：54
|
作者：
Jin, Youliang [1 ,2 ]
Song, Baoan [1 ,2 ,3 ]
Jia, Zhitai [3 ]
Zhang, Yinan [4 ]
Lin, Changgui [1 ,2 ]
Wang, Xunsi [1 ,2 ]
Dai, Shixun [1 ,2 ]
机构：
[1] Ningbo Univ, Lab Infrared Mat & Devices, Ningbo 315211, Zhejiang, Peoples R China
[2] Ningbo Univ, Key Lab Photoelect Detect Mat & Devices Zhejiang, Ningbo 315211, Zhejiang, Peoples R China
[3] Shandong Univ, State Key Lab Crystal Mat, Jinan 250100, Peoples R China
[4] Swinburne Univ Technol, Fac Sci Engn & Technol, Ctr Microphoton, Hawthorn, Vic 3122, Australia
来源：
OPTICS EXPRESS | 2017年 / 25卷 / 01期
关键词：
REFRACTIVE-INDEX; CONSTANTS; PARAMETERS; TRANSMITTANCE; SUBSTRATE; PATTERN; LAYER;
D O I：
10.1364/OE.25.000440
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A tangencypoint method (TPM) is presented to derive the thickness and optical constants of chalcogenide thin films from their transmission spectra. It solves the problem of the abnormal value of thickness in the strong absorption region obtained by Swanepoel method. The accuracy of the thickness and refractive index is better than 0.5% by using this method. Moreover, comparing with Swanepoel method by using the same simulation and experimental data from the transmission spectrum, the accuracy of the thickness and refractive index obtained by the TPM is higher in the strong absorption region. Finally the dispersion and absorption coefficient of the chalcogenide films are obtained based on the experimental data of the transmission spectrum by using the TPM. (C) 2017 Optical Society of America
引用
收藏
页码：440 / 451
页数：12
相关论文
共 50 条
  • [1] Determination of optical properties in nanostructured thin films using the Swanepoel method
    Sanchez-Gonzalez, J.
    Diaz-Parralejo, A.
    Ortiz, A. L.
    Guiberteau, F.
    APPLIED SURFACE SCIENCE, 2006, 252 (17) : 6013 - 6017
  • [2] Determining the refractive index dispersion and thickness of hot-pressed chalcogenide thin films from an improved Swanepoel method
    Y. Fang
    D. Jayasuriya
    D. Furniss
    Z. Q. Tang
    Ł. Sojka
    C. Markos
    S. Sujecki
    A. B. Seddon
    T. M. Benson
    Optical and Quantum Electronics, 2017, 49
  • [3] Determining the refractive index dispersion and thickness of hot-pressed chalcogenide thin films from an improved Swanepoel method
    Fang, Y.
    Jayasuriya, D.
    Furniss, D.
    Tang, Z. Q.
    Sojka, L.
    Markos, C.
    Sujecki, S.
    Seddon, A. B.
    Benson, T. M.
    OPTICAL AND QUANTUM ELECTRONICS, 2017, 49 (07)
  • [4] Impacts of thickness reduction and heat treatment on the optical properties of thin chalcogenide films
    Adam, A. M.
    Petkov, P.
    CERAMICS INTERNATIONAL, 2017, 43 (14) : 11015 - 11022
  • [5] Extension of the Swanepoel method for obtaining the refractive index of chalcogenide thin films accurately at an arbitrary wavenumber
    Jin, Youliang
    Song, Baoan
    Lin, Changgui
    Zhang, Peiqing
    Dai, Shixun
    Xu, TieFeng
    Nie, Qiuhua
    OPTICS EXPRESS, 2017, 25 (25): : 31273 - 31280
  • [6] A Study of Optical Parameters of Tin Sulphide Thin Films Using the Swanepoel Method
    Ragina, A. J.
    Murali, K. V.
    Preetha, K. C.
    Deepa, K.
    Remadevi, T. L.
    OPTICS: PHENOMENA, MATERIALS, DEVICES, AND CHARACTERIZATION: OPTICS 2011: INTERNATIONAL CONFERENCE ON LIGHT, 2011, 1391
  • [7] Optical properties of thin chalcogenide amorphous films
    Lukic, SR
    SOLID STATE PHENOMENA, 1998, 61-2 : 97 - 104
  • [8] OPTICAL METHOD FOR THE THICKNESS OF THIN FILMS
    SCOTT, GD
    ANALYTICAL CHEMISTRY, 1949, 21 (11) : 1437 - 1437
  • [9] AN OPTICAL METHOD FOR THE THICKNESS OF THIN FILMS
    SCOTT, GD
    JOURNAL OF APPLIED PHYSICS, 1950, 21 (01) : 72 - 72
  • [10] Optical properties of ternary chalcogenide thin films with SnTe
    Petkov, P
    Vassilev, V
    Petkova, T
    Monchev, B
    Aljihmani, L
    JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 2005, 7 (04): : 1965 - 1969
12345