Cross-Order Echelle Grating Triplexer Based on Amorphous Silicon Nanowire Platform

被引：0
|
作者：
Zhu, Ning [1 ,2 ,3 ,4 ]
Song, Jun [1 ,2 ,3 ]
Wosinski, Lech [2 ,3 ,4 ]
He, Sailing [1 ,2 ,3 ]
机构：
[1] Zhejiang Univ, Ctr Opt & Electromagnet Res, State Key Lab Modern Opt Instrumentat, Hangzhou, Zhejiang, Peoples R China
[2] Royal Inst Technol, Joint Res Ctr Photon, Stockholm, Sweden
[3] Zhejiang Univ, Hangzhou, Zhejiang, Peoples R China
[4] Royal Inst Technol, Dept Microelect & Appl Phys, S-16440 Kista, Sweden
来源：
2008 7TH INTERNATIONAL CONFERENCE ON THE OPTICAL INTERNET (COIN) | 2008年
关键词：
Waveguide components; SOI; WDM; integrated optoelectronics; triplexer;
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
We present fabrication and measurement results of an ultracompact silicon-on-insulator-based echelle-grating triplexer, which uses different diffraction orders to cover a large spectral range from 1.3 mu m to 1.5 mu m, with a footprint of 150 mu m x 200 mu m.
引用
收藏
页码：37 / +
页数：2
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