Closing the gap between electron and X-ray crystallography

被引：5
|
作者：
Mugnaioli, Enrico [1 ]
机构：
[1] Univ Siena, Dipartimento Sci Fis Terra & Ambiente, I-53100 Siena, Italy
来源：
ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE CRYSTAL ENGINEERING AND MATERIALS | 2015年 / 71卷
关键词：
dynamical diffraction; electron diffraction tomography; electron crystallography; AUTOMATED DIFFRACTION TOMOGRAPHY; CRYSTAL-STRUCTURE REFINEMENT; PATTERNS;
D O I：
10.1107/S2052520615022441
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
引用
收藏
页码：737 / 739
页数：3
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