Reliability equivalence of independent and non-identical components series systems

被引：30
|
作者：
Sarhan, A [1 ]
机构：
[1] Mansoura Univ, Dept Math, Mansoura 35516, Egypt
来源：
RELIABILITY ENGINEERING & SYSTEM SAFETY | 2000年 / 67卷 / 03期
关键词：
imperfect switch method; cold duplication method; warm reliability equivalence factor;
D O I：
10.1016/S0951-8320(99)00069-1
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
This paper is devoted to obtain the reliability equivalence factors of n independent and non-identical components series system. The lifetime of each component is assumed to be exponentially distributed random variable. The results introduced by Rade [Rade L. Reliability equivalence. Microelectronics and Reliability 1993a;33:323-5; Rade L, Reliability survival equivalence. Microelectronics and Reliability 1993b;33:881-94.] can be obtained as special cases from this work when n = 1.2 and assuming the components are identical. (C) 2000 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码：293 / 300
页数：8
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