DC Arc Model Based on 3-D DC Arc Simulation

被引：28
|
作者：
Rau, Shiuan-Hau [1 ]
Lee, Wei-Jen [1 ]
机构：
[1] Univ Texas Arlington, Dept Elect Engn, Arlington, TX 76019 USA
来源：
IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS | 2016年 / 52卷 / 06期
关键词：
Arc flash; arc flash hazard; arc resistance; arc voltage; dc arc modeling; dc arc simulation; magnetohydrodynamic (MHD) modeling; ELECTRIC-ARC; FLASH;
D O I：
10.1109/TIA.2016.2587760
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
DC arc flash hazard assessment is a mounting concern with the recent development of large-scale photovoltaic arrays and dc buses. Currently, there are few methods available to model dc arcs and are largely based on historical arc tests, which may not be suitable for modern dc applications. In order to provide a suitable method to predict dc arc flash properties in power systems, new dc arc model development is necessary. Historically, model development was constrained by time consuming and limited laboratory arc flash tests. This paper proposes a new dc arc model based on 3-D dc arc simulation that is capable of providing comparable results to available lab testing.
引用
收藏
页码：5255 / 5261
页数：7
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