Polarization model for total internal reflection-based retroreflectors

被引:8
|
作者
Zhu, Minhao [1 ,2 ]
Li, Yan [1 ]
Ellis, Jonathan D. [2 ,3 ]
机构
[1] Tsinghua Univ, Dept Precis Instrument, State Key Lab Precis Measurement Technol & Instru, Beijing 100084, Peoples R China
[2] Univ Rochester, Dept Mech Engn, Rochester, NY 14627 USA
[3] Univ Rochester, Inst Opt, Rochester, NY 14627 USA
关键词
retroreflector; polarization; interferometers; etrology; CORNER; CALCULUS; LASER;
D O I
10.1117/1.OE.53.6.064101
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A theoretical model has been developed to analyze the output polarization state of a total internal reflection-based retroreflector as a function of pitch and yaw motions. There are six different beam paths in the retroreflector, and thus output polarization states, for a given pitch or yaw misalignment. This polarization model discusses the electric field changes of the laser beam based on Fresnel equations for phase and polarization change on reflection. Jones matrices are computed based on Snell's law, Fresnel equations, the solid geometry, and coordinate transformations to obtain a Jones matrix model of the retroreflector for a given misalignment. Modeling results show that there is always a rotation to the input beam's polarization and there are specific input regions that are not sensitive to pitch motions but are sensitive to yaw motions. Validation of the model is also presented, using both theoretical and experimental results published by Kalibjian in 2004. (c) 2014 Society of Photo-Optical Instrumentation Engineers (SPIE)
引用
收藏
页数:13
相关论文
共 50 条
  • [41] Total internal reflection
    Gwyneth Jones
    Nature, 2000, 403 : 707 - 707
  • [42] Reflection-Based Short Pulse Generation in CMOS
    Khoeini, Farzad
    Hadidian, Bahareh
    Zhang, Keshu
    Afshari, Ehsan
    IEEE SOLID-STATE CIRCUITS LETTERS, 2020, 3 : 318 - 321
  • [43] Reflection-based deflection routing in OPS networks
    Morita, Masayuki
    Tode, Hideki
    Murakami, Koso
    IEICE TRANSACTIONS ON COMMUNICATIONS, 2008, E91B (02) : 409 - 417
  • [44] A Reflection-Based Approach for Reusing Software Architecture
    Ye Peng
    Ying Shi
    Yuan Wen-Jie
    Yao Jun-Feng
    Luo Ju-Bo
    Zhang Lin-Lin
    2008 4TH INTERNATIONAL CONFERENCE ON WIRELESS COMMUNICATIONS, NETWORKING AND MOBILE COMPUTING, VOLS 1-31, 2008, : 5550 - 5553
  • [45] REFLECTION-BASED INTERPOLATION IN NODAL REACTOR SIMULATION
    ANAF, J
    BECKER, M
    TRANSACTIONS OF THE AMERICAN NUCLEAR SOCIETY, 1982, 41 : 625 - 626
  • [46] Polarization-dependent optical absorption of graphene under total internal reflection
    Ye, Qing
    Wang, Jin
    Liu, Zhibo
    Deng, Zhi-Chao
    Kong, Xian-Tian
    Xing, Fei
    Chen, Xu-Dong
    Zhou, Wen-Yuan
    Zhang, Chun-Ping
    Tian, Jian-Guo
    APPLIED PHYSICS LETTERS, 2013, 102 (02)
  • [47] Measurement of single macromolecule orientation by total internal reflection fluorescence polarization microscopy
    Forkey, JN
    Quinlan, ME
    Goldman, YE
    BIOPHYSICAL JOURNAL, 2005, 89 (02) : 1261 - 1271
  • [48] Photothermal Spectroscopy in Attenuated Total Internal Reflection Geometry by Polarization Rotation and Deflection
    Rayaluru, Mythreyi
    Maitra, Anwesha
    Pennathur, Anuj K.
    Dawlaty, Jahan M.
    JOURNAL OF PHYSICAL CHEMISTRY C, 2024, 128 (47): : 20230 - 20237
  • [49] Refractive Index and Dispersion Measurement Principle with Polarization Change in Total Internal Reflection
    Chang, Jyun-Ping
    Tsai, Cheng-Mu
    Weng, Jun-Hong
    Han, Pin
    PHOTONICS, 2024, 11 (06)
  • [50] Immunosensor based on total internal reflection fluorescence principle
    Lu, Bin
    Wei, Yu
    Zhongguo shengwu yixue gongcheng xuebao, 1993, 12 (02): : 142 - 148