Mixing mechanism of h-GaN in c-GaN growth on GaAs (001) substrates

被引:0
|
作者
Hashimoto, A
Wada, H
Ueda, T
Nishio, Y
Masuda, A
Yamamoto, A
机构
[1] Fukui Univ, Dept Elect & Elect Engn, Fukui 9100017, Japan
[2] Japan Adv Inst Sci & Technol, Sch Mat Sci, Tatsunokuchi, Ishikawa 9231292, Japan
来源
关键词
D O I
10.1002/(SICI)1521-396X(199911)176:1<519::AID-PSSA519>3.0.CO;2-A
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Systematic investigation of the V/III ratio dependence in the mixing of the h-GaN phase to the c-GaN layers grown on GaAs (001) substrates has been performed and a drastical change of the mixing nature in the initial process is reported. The h-GaN mixing nature on the {111} facets during growth strongly depends on the V/III ratio in the initial buffer layer formation. The h-GaN grain-mixing only occurs on (111)A facets under a Ga-rich formation condition, but the h-GaN mixing grains on the {111}B facets gradually appear together with the vanishing of h-GaN grains on the {111}A facets during the annealing process under rf-nitrogen beam irradiation. The mixing processes under N-rich and Ga-rich growth conditions are also discussed. The results indicate that it is possible to grow high quality c-GaN layers by control of the mixing at the initial growth stage through the effective V/III ratio dependence.
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页码:519 / 524
页数:6
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