High-energy resolution PIXE study of heat induced changes in cadmium compounds using ion microbeam

被引：0
|
作者：
Tadic, T
Mokuno, Y
Horino, Y
Jaksic, M
Desnica, ID
Trojko, R
机构：
[1] Rudjer Boskovic Inst, HR-10001 Zagreb, Croatia
[2] Osaka Natl Res Inst, Ikeda, Osaka 563857, Japan
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1999年 / 158卷 / 1-4期
关键词：
ion microbeam; high-resolution PIXE; chemical effects; cadmium;
D O I：
10.1016/S0168-583X(99)00320-1
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
The intensity changes of the satellite X-ray line spectra can be related to the changes in the chemical environment of atoms in the sample. High-energy resolution PIXE analysis of chemical effects in X-ray spectra of Cd L lines was applied in studies of heat-treated CdS and CdTe cadmium compounds. The applicability of the method for monitoring crystal phases and chemical states in these and other materials using ion microbeam with high energy resolution PIXE spectrometer is discussed. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：241 / 244
页数：4
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