Surface investigation of ZIF thin films

被引:0
|
作者
Benz, Lauren [1 ]
Gomez, Andres [1 ]
Mosier, Amber M. [1 ]
机构
[1] Univ San Diego, Dept Chem & Biochem, San Diego, CA 92110 USA
来源
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 2013年 / 246卷
关键词
D O I
暂无
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
143-ENFL
引用
收藏
页数:1
相关论文
共 50 条
  • [11] An investigation of the surface morphology of nanostructured nickel thin films prepared by electrodeposition
    Torabi, Morteza
    Dolati, A.
    INTERNATIONAL JOURNAL OF SURFACE SCIENCE AND ENGINEERING, 2016, 10 (05) : 444 - 455
  • [12] INVESTIGATION OF THIN INSULATING FILMS USING THE SURFACE IONIC CHARGE TECHNIQUE
    ROIZIN, YO
    VASILENKO, VS
    DAUS, LG
    THIN SOLID FILMS, 1992, 207 (1-2) : 185 - 192
  • [13] STRUCTURAL, SURFACE MORPHOLOGY, OPTICAL AND ELECTRICAL INVESTIGATION OF CdSe THIN FILMS
    Thirumavalavan, S.
    Mani, K.
    Suresh, S.
    CHALCOGENIDE LETTERS, 2015, 12 (05): : 237 - 246
  • [14] Coupled long range surface plasmons for the investigation of thin films and interfaces
    Dostalek, Jakub
    Roskamp, Robert F.
    Knoll, Wolfgang
    SENSORS AND ACTUATORS B-CHEMICAL, 2009, 139 (01) : 9 - 12
  • [15] STRUCTURAL INVESTIGATION OF THIN FILMS
    WALKER, GA
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1970, 7 (04): : 465 - &
  • [16] INVESTIGATION OF THIN-FILMS FORMED ON AN AQUEOUS SURFACE FROM DICHLOROETHANE SOLUTIONS
    ATANASSOV, RD
    PLATIKANOV, DN
    KAISHEVA, MK
    JOURNAL OF COLLOID AND INTERFACE SCIENCE, 1995, 169 (01) : 79 - 84
  • [17] XPS INVESTIGATION OF THE SURFACE-COMPOSITION OF SPUTTERED YBCO THIN-FILMS
    BEYER, J
    SCHURIG, T
    MENKEL, S
    QUAN, Z
    KOCH, H
    PHYSICA C, 1995, 246 (1-2): : 156 - 162
  • [18] Investigation of localized surface plasmon resonance of TiN nanoparticles in TiNxOy thin films
    Zhang, J.
    Chen, T. P.
    Li, X. D.
    Liu, Y. C.
    Liu, Y.
    Yang, H. Y.
    OPTICAL MATERIALS EXPRESS, 2016, 6 (07): : 2422 - 2433
  • [19] A METHOD OF REMOVING THIN OXIDE FILMS FROM THE SURFACE OF TITANIUM AND THE INVESTIGATION OF THEIR STRUCTURES
    TOMASHOV, ND
    ALTOVSKII, RM
    KUSHNEREV, MY
    INDUSTRIAL LABORATORY, 1960, 26 (03): : 315 - 317
  • [20] The investigation of thin surface films on metals by means of reflected polarized light.
    Tronstad, L
    TRANSACTIONS OF THE FARADAY SOCIETY, 1933, 29 : 0502 - 0513