Point contact Andreev reflection by nanoindentation of polymethyl methacrylate

被引：4
|
作者：
Clifford, E. [1 ]
Coey, J. M. D.
机构：
[1] Univ Dublin Trinity Coll, Sch Phys, Dublin 2, Ireland
[2] Univ Dublin Trinity Coll, CRANN, Dublin 2, Ireland
来源：
APPLIED PHYSICS LETTERS | 2006年 / 89卷 / 09期
基金：
爱尔兰科学基金会;
关键词：
SPIN POLARIZATION; CRO2; FERROMAGNETS; FILMS;
D O I：
10.1063/1.2345361
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
A versatile technique for performing spin polarization measurements via point contact Andreev reflection has been developed. This technique involves depositing a superconductor (lead) onto a thin film of the material to be studied through a nanohole formed in a layer of photoresist, using an atomic force microscope as a nanoindenter. Copper and nickel were used to demonstrate the method. The polarizations of CrO2 and Co2MnSi were also measured, the former giving a value of 95%, as expected, and the latter giving 20%, which was surprisingly low for a candidate half metal. (c) 2006 American Institute of Physics.
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页数：3
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