Retardance properties of Twisted Ferro-electric Liquid Crystal

被引：2
|
作者：
Babilotte, Philippe [1 ,2 ]
Sathaye, Kedar [1 ,3 ]
Silva, Vinicius N. H. [1 ,3 ,4 ]
机构：
[1] Univ Europeenne Bretagne, F-35000 Rennes, France
[2] Univ Bretagne Occidentale, LSOL, CS 93837, EA 938, F-29238 Brest, France
[3] Telecom Bretagne, Inst Mines Telecom, Dept Opt, CS 83818, F-29238 Brest 03, France
[4] Univ Fed Fluminense, Telecommun Engn Dept, BR-24220 Niteroi, RJ, Brazil
来源：
OPTIK | 2014年 / 125卷 / 14期
关键词：
Optical measuring techniques; Optical properties of materials; Mueller polarimetry; Total retardance; MUELLER MATRIX POLARIMETRY; POLAR DECOMPOSITION; SILICON DISPLAY; RETARDER; CELLS; ORDER;
D O I：
10.1016/j.ijleo.2014.01.070
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
The present work presents, for the first time, the dynamic evolution of the hysteresis loops R(V), specifically based onto the total retardance polarimetric parameter R(t) extracted from the Mueller Matrix (MM) of Twisted Ferro-electric Liquid Crystal (TwFLC) samples. This evolution is given for increased exposure time T-exp to a rectangular periodic electric field E-app preliminary applied to the sample, before performing the polarimetric measurements. The Mueller Matrix formalism used is found as a relevant non-destructive and non invasive full-optical method to characterize and to monitor the Twisted Ferroelectric Liquid Crystal cell dynamic behaviour under external applied electric field, before reaching the so-called stripes regime. (C) 2014 Elsevier GmbH. All rights reserved.
引用
收藏
页码：3646 / 3652
页数：7
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