Effects of Deposition Inclination Angle on Microstructure and Electrical Properties of Al-Doped ZnO Coating Films

被引:0
|
作者
Li, Tse-Chang [1 ]
Han, Chang-Fu [1 ]
Chung, Chung-Jen [2 ]
Lin, Jen-Fin [1 ,2 ]
机构
[1] Natl Cheng Kung Univ, Dept Mech Engn, Tainan 701, Taiwan
[2] Natl Cheng Kung Univ, Ctr Micro Nano Sci & Technol, Tainan 701, Taiwan
关键词
POLYETHYLENE TEREPHTHALATE SUBSTRATE; ZINC-OXIDE FILMS; THIN-FILMS; OPTICAL-PROPERTIES; BAND-GAP; QUALITY; SIZE; XPS; TEMPERATURE;
D O I
10.1111/ijac.12423
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
A flat plate in the deposition stage is designed to be tilted flexibly to form an inclination angle () between an ion beam and the direction normal to a polyethylene terephthalate (PET) substrate. Five kinds of PET/aluminum-doped zinc oxide specimens were prepared to examine the effects of inclination angle on the microstructures, crystals, chemical compositions, and electrical properties. An increase in the inclination angle results in X-ray diffraction peak intensity variations in ZnO and a reduction in the composite d-spacing. As the measure of the oxygen vacancies, the O-2-peak intensity ratio (IRO2) obtained using the X-ray photoelectron spectrometry (XPS) is evaluated. The IRO2 value increased with increasing the inclination angle, and it is proportional to the porosity integration over the visible light wavelengths. An increase in IRO2 is favorable for the reduction in composite grain size (g(Composite)). A smaller composite grain size (g(Composite)) of ZnO particles and a larger energy gap (E-g) can be obtained from applications of nonzero inclination angle. An appropriate nonzero inclination angle increases hardness and reduced elastic modulus and decreases the carrier concentration and carrier mobility of the specimen significantly.
引用
收藏
页码:152 / 163
页数:12
相关论文
共 50 条
  • [31] Structural and Electrical Properties of Atomic Layer Deposited Al-Doped ZnO Films
    Lee, Do-Joong
    Kim, Hyun-Mi
    Kwon, Jang-Yeon
    Choi, Hyoji
    Kim, Soo-Hyun
    Kim, Ki-Bum
    ADVANCED FUNCTIONAL MATERIALS, 2011, 21 (03) : 448 - 455
  • [32] Role of defects and microstructure on the electrical properties of solution-processed Al-doped ZnO transparent conducting films
    Kumar, Anurag
    Ahmad, Imteyaz
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2020, 126 (08):
  • [33] Role of defects and microstructure on the electrical properties of solution-processed Al-doped ZnO transparent conducting films
    Anurag Kumar
    Imteyaz Ahmad
    Applied Physics A, 2020, 126
  • [34] Microstructure and Optical and Electrical Properties of Al-Doped ZnO Thin Films Prepared by RF Magnetron Sputtering Method
    Xu Shaoliang
    Pang Xiaolu
    Yang Huisheng
    Zhang Boping
    RARE METAL MATERIALS AND ENGINEERING, 2011, 40 : 451 - 454
  • [35] Influence of the target power on the microstructure and electrical properties of Al-doped ZnO thin films deposited at room temperature
    Liu, Hongyan
    Wang, Xiaoqiang
    Li, Mingya
    Wu, Lei
    Yan, Yao
    Xiong, Jie
    Qu, Xiujie
    An, Qi
    Zhu, Lin
    CERAMICS INTERNATIONAL, 2020, 46 (08) : 11978 - 11987
  • [36] Growth morphology and electrical/optical properties of Al-doped ZnO thin films grown by atomic layer deposition
    Dhakal, Tara
    Vanhart, Daniel
    Christian, Rachel
    Nandur, Abhishek
    Sharma, Anju
    Westgate, Charles R.
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2012, 30 (02):
  • [38] Al-doped ZnO: Electronic, electrical and structural properties
    Maldonado, Frank
    Stashans, Arvids
    JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 2010, 71 (05) : 784 - 787
  • [39] Atomic layer deposition of Al-doped ZnO thin films
    Tynell, Tommi
    Yamauchi, Hisao
    Karppinen, Maarit
    Okazaki, Ryuji
    Terasaki, Ichiro
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2013, 31 (01):
  • [40] Effects of annealing conditions and film thickness on electrical and optical properties of epitaxial Al-doped ZnO films
    Kuprenaite, S.
    Abrutis, A.
    Kubilius, V.
    Murauskas, T.
    Saltyte, Z.
    Plausinaitiene, V.
    THIN SOLID FILMS, 2016, 599 : 19 - 26