Open-ended waveguide dielectric probe using time-domain measurements

被引：1
|
作者：
Chan, Kevin [1 ]
Rambabu, Karumudi [1 ]
Boulanger, Pierre [2 ]
机构：
[1] Univ Alberta, Dept Elect & Comp Engn, Edmonton, AB T6G 1H9, Canada
[2] Univ Alberta, Dept Comp Sci, Edmonton, AB, Canada
来源：
MICROWAVE AND OPTICAL TECHNOLOGY LETTERS | 2018年 / 60卷 / 05期
关键词：
dielectric probe; material characterization; nondestructive evaluation; open-ended waveguide probe; reflection coefficient analysis;
D O I：
10.1002/mop.31119
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The method of using a coaxial-to-waveguide adaptor as a broadband dielectric probe with time-domain measurements is presented. The reflected pulses at the aperture of the open-ended waveguide are measured for short circuit and dielectric slab loads. A reflection coefficient frequency response analysis is applied to the pulses for the relative permittivity extraction of the dielectric slab. Dispersion compensation is introduced for error correction. Accuracies of within 10% are achievable for an octave bandwidth.
引用
收藏
页码：1108 / 1112
页数：5
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