PARAMETERS FOR ANALYSIS OF SURFACE ROUGHNESS AND MICRORELIEF MATERIALS BY AFM.

被引：0
|
作者：
Tolstikhina, A. L. [1 ]
Arutyunov, P. A. [2 ]
Demidov, V. N. [2 ]
机构：
[1] Inst Crystallog, Moscow 117333, Russia
[2] Moscow State Inst Elect & Math, Moscow 109028, Russia
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 1999年 / 55卷
关键词：
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
P05.16.023
引用
收藏
页码：546 / 546
页数：1
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