Electron capture imaging of two-dimensional materials

被引：0

作者：

Dubois, Alain ^{[1
]}

Labaigt, Gabriel ^{[1
]}

Hansen, Jan Petter ^{[2
]}

机构：

[1] UPMC CNRS, Lab Chim Phys Matiere & Rayonnement, UMR 7614, F-75005 Paris, France

[2] Univ Bergen, Dept Phys & Technol, N-5007 Bergen, Norway

来源：

XXIX INTERNATIONAL CONFERENCE ON PHOTONIC, ELECTRONIC, AND ATOMIC COLLISIONS (ICPEAC2015), PTS 1-12 | 2015年 / 635卷

关键词：

D O I：

10.1088/1742-6596/635/3/032025

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The principles of an imaging technique for 2D materials are presented. It is based on the measurement of differential cross sections for electron capture induced by impact of keV-proton on such materials. We illustrate these principles for graphene target and demonstrate the selectivity of this technique upon materials, geometries and surface defects through the highly coherent phenomenon giving rise to the imaging pattern.

引用

页数：1

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