Single-Slope Look-Ahead Ramp ADC for CMOS Image Sensors

被引:22
|
作者
Elmezayen, Mohamed R. [1 ]
Wu, Bingxing [2 ]
Ay, Suat Utku [1 ]
机构
[1] Univ Idaho, Elect & Comp Engn Dept, Moscow, ID 83844 USA
[2] Thermo Sci FEI Corp, Shanghai 201206, Peoples R China
关键词
CMOS technology; Generators; Latches; CMOS image sensors; Analog-digital conversion; Signal resolution; Acceleration; Integrating ADC; ramp ADC; single-slope ADC; single-slope look-ahead ramp ADC; CMOS APS imager; column-parallel architecture; VOLTAGE;
D O I
10.1109/TCSI.2020.3007882
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Integrating type analog-to-digital converters (ADC) used in column-parallel CMOS image sensors trade conversion speed with size, power, and complexity to achieve optimal performance. A new integrating ADC architecture called single-slope look-ahead ramp (SSLAR) ADC is introduced in this paper. It utilizes a statistical approach and code-prediction methods to improve the conversion speed of standard single-slope ramp (SSR) ADC. It is shown that SSLAR ADC reduces power consumption while achieving an increased frame rate. This is achieved by the SSLAR algorithm that was optimized for column-parallel CMOS active pixel sensor (APS) imager architecture. A 10-bit SSLAR ADC was designed in a 0.5 mu m CMOS (2P3M) process and integrated with a column-parallel CMOS image sensor that has 200x150 array with 15 mu m pixels. Measurements showed that a 6x frame rate increase can be achieved while reducing power consumption 13% with minimal impact on image quality.
引用
收藏
页码:4484 / 4493
页数:10
相关论文
共 50 条
  • [41] Status Counting Double Edge Slope ADC for CMOS Image Sensors
    Ma, Cheng
    Xin, Guo-Song
    Li, Jing
    Li, Yang
    Liu, Yang
    Zhou, Quan
    Wang, Xin-Yang
    Chang, Yu-Chun
    2018 14TH IEEE INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUIT TECHNOLOGY (ICSICT), 2018, : 1011 - 1013
  • [42] A 512-ns conversion time 13-bit parallel two-step single-slope ADC for hundreds of mpxiel CMOS image sensors
    Xu, Ruiming
    Guo, Zhongjie
    Su, Changxu
    Liu, Suiyang
    Yu, Ningmei
    ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING, 2025, 122 (02)
  • [43] An Automatic Slope-Calibrated Ramp Generator for Single-Slope ADCs
    Huang, Shoudong
    Lu, Wengao
    Zhou, Ye
    Yu, Shanzhe
    Zhang, Yacong
    Shi, Xueyou
    Chen, Zhongjian
    2019 IEEE 13TH INTERNATIONAL CONFERENCE ON ASIC (ASICON), 2019,
  • [44] A 28.9-38.8 μW dual-mode 10-bit column parallel single-slope ADC with minimum voltage feedback for CMOS image sensors
    Yuan, Shengping
    Li, Zhoudeng
    Yu, Shanghong
    Yin, Fanghui
    Tang, Xian
    MICROELECTRONICS JOURNAL, 2024, 145
  • [45] Optimal design of 10-bit single-slope ADC for CMOS image sensor based on swarm intelligent optimization algorithm
    Ma, Yan-Hua
    Li, Ji-Tong
    Zhu, Ming
    Chang, Yu-Chun
    IET CIRCUITS DEVICES & SYSTEMS, 2021, 15 (08) : 787 - 802
  • [46] A self-compensated approach for ramp kickback noise in CMOS image sensor column parallel single slope ADC
    Guo, Zhongjie
    Yu, Ningmei
    Wu, Longsheng
    MICROELECTRONICS JOURNAL, 2022, 120
  • [47] Zero-crossing-prediction-based Single-slope ADC with a Constant Charge Bias Amplifier for Low Power Image Sensors
    Park, Keunyeol
    Lee, Hohyeon
    Kim, Soo Youn
    2022 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS 22), 2022, : 2787 - 2791
  • [48] Multiple-ramp column-parallel ADC architectures for CMOS image sensors
    Snoeij, Martijn E.
    Theuwissen, Albert J. R.
    Makinwa, Kofi A. A.
    Huijsing, Johan H.
    IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2007, 42 (12) : 2968 - 2977
  • [49] A 12-bit single slope ADC with multi-step structure and ramp calibration technique for image sensors
    Li, Hao
    Liu, Dongsheng
    Liang, Yingxiang
    Hu, Ang
    Nie, Zheng
    Zhang, Chengcheng
    Li, Kaiyue
    Niu, Guangda
    Gao, Liang
    Tang, Jiang
    MICROELECTRONICS JOURNAL, 2023, 139
  • [50] A Wideband 4-Phase Phase-Locked Loop for Single-Slope Ramp ADC in SCA ASIC
    Wang, Yuting
    Zhao, Lei
    Qin, Jiajun
    Guo, Jiacheng
    Li, Li
    Liu, Shubin
    An, Qi
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2023, 70 (06) : 1015 - 1022