Effect of alumina and chromium interlayers on microstructures and optical properties of thin Ag films on glass substrates

被引：1
|
作者：
Sun Xi-Lian [1 ]
Shao Jian-Da
机构：
[1] Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Shanghai 201800, Peoples R China
[2] Chinese Acad Sci, Grad Sch, Beijing 100049, Peoples R China
来源：
CHINESE PHYSICS LETTERS | 2006年 / 23卷 / 09期
关键词：
5;
D O I：
10.1088/0256-307X/23/9/063
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
Effects of alumina and chromium interlayers on the microstructure and optical properties of thin Ag films are investigated by using spectrophotometry, x-ray diffraction and AFM. The characteristics of Ag films in Ag/glass, Ag/Al2O3/glass and Ag/Cr/glass stacks are analysed. The results indicate that the insertion of an Al2O3 or Cr layer decreases the grains and influences the reflectance of Ag films. The reflectance of the Ag film can be increased by controlling the thickness of alumina interlayer. The stability of Ag films is improved and the adhesion of Ag films on glass substrates is enhanced by alumina as an interlayer.
引用
收藏
页码：2576 / 2578
页数：3
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