Imaging of adherent platelets by atomic force microscopy (AFM)

被引:0
|
作者
Rao, GHR
White, JG
机构
[1] UNIV MINNESOTA, SCH MED, DEPT LAB MED, MINNEAPOLIS, MN 55455 USA
[2] UNIV MINNESOTA, SCH MED, DEPT PATHOL, MINNEAPOLIS, MN 55455 USA
关键词
D O I
暂无
中图分类号
R5 [内科学];
学科分类号
1002 ; 100201 ;
摘要
引用
收藏
页码:PS294 / PS294
页数:1
相关论文
共 50 条
  • [41] Imaging polysaccharides by atomic force microscopy
    Kirby, AR
    Gunning, AP
    Morris, VJ
    BIOPOLYMERS, 1996, 38 (03) : 355 - 366
  • [42] Imaging fibers by atomic force microscopy
    Carter, MMC
    McIntyre, NS
    Davidson, R
    King, HW
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (03): : 1867 - 1869
  • [43] Fidelity imaging for atomic force microscopy
    Ghosal, Sayan
    Salapaka, Murti
    APPLIED PHYSICS LETTERS, 2015, 106 (01)
  • [44] Imaging by touching: Atomic force microscopy
    Ariel Schwartz, Gustavo
    Navarro, Jaume
    PHILOSOPHY OF PHOTOGRAPHY, 2018, 9 (01) : 41 - 52
  • [45] Atomic Force Microscopy (AFM) Analysis of an Object Larger and Sharper than the AFM Tip
    Chen, Zhe
    Luo, Jiawei
    Doudevski, Ivo
    Erten, Sema
    Kim, Seong H.
    MICROSCOPY AND MICROANALYSIS, 2019, 25 (05) : 1106 - 1111
  • [46] Improving Atomic Force Microscopy imaging with the adaptation of ultrasonic force microscopy
    Druffner, CJ
    Sathish, S
    NONDESTRUCTIVE EVALUATION AND RELIABILITY OF MICRO-AND NANOMATERIAL SYSTEMS, 2002, 4703 : 105 - 113
  • [47] ATOMIC RESOLUTION IMAGING OF A NONCONDUCTOR BY ATOMIC FORCE MICROSCOPY
    ALBRECHT, TR
    QUATE, CF
    JOURNAL OF APPLIED PHYSICS, 1987, 62 (07) : 2599 - 2602
  • [48] Imaging and force probing RNA by atomic force microscopy
    Schon, Peter
    METHODS, 2016, 103 : 25 - 33
  • [49] Dual-Frequency Atomic Force Microscopy Imaging Method and Experiment Based on Commercial AFM Platform
    王伟
    钱建强
    李英姿
    陈注里
    Chinese Physics Letters, 2013, 30 (06) : 60 - 61
  • [50] SIMULTANEOUS ATOMIC FORCE-SCANNING ELECTROCHEMICAL MICROSCOPY (AFM-SECM) IMAGING OF COPPER DISSOLUTION
    Izquierdo, J.
    Fernandez-Perez, B. M.
    Eifert, A.
    Souto, R. M.
    Kranz, C.
    ELECTROCHIMICA ACTA, 2016, 201 : 320 - 332