Direct Detectors for Electron Microscopy

被引:18
|
作者
Clough, R. N. [1 ]
Moldovan, G. [2 ]
Kirkland, A. I. [1 ]
机构
[1] Univ Oxford, Dept Mat, Parks Rd, Oxford OX1 3PH, England
[2] Oxford Instruments NanoAnal, High Wycombe HP12 3SE, Bucks, England
关键词
D O I
10.1088/1742-6596/522/1/012046
中图分类号
TH742 [显微镜];
学科分类号
摘要
There is interest in improving the detectors used to capture images in transmission electron microscopy. Detectors with an improved modulation transfer function at high spatial frequencies allow for higher resolution in images at lower magnification, which leads to an increased effective field of view. Detectors with improved detective quantum efficiency are important for low dose applications. One way in which these performance enhancements can be achieved is through direct detection, where primary electrons are converted directly into suitable electrical signals by the detector rather than relying on an indirect electron to photon conversion before detection. In this paper we present the characterisation of detector performance for a number of different direct detection technologies, and compare these technologies to traditional indirect detectors. Overall our results show that direct detection enables a significant improvement in all aspects of detector performance.
引用
收藏
页数:4
相关论文
共 50 条
  • [21] Single event imaging for electron microscopy using MAPS detectors
    McMullan, G.
    Turchetta, R.
    Faruqi, A. R.
    JOURNAL OF INSTRUMENTATION, 2011, 6
  • [22] Ultrafast electron microscopy integrated with a direct electron detection camera
    Lee, Young Min
    Kim, Young Jae
    Kim, Ye-Jin
    Kwon, Oh-Hoon
    STRUCTURAL DYNAMICS-US, 2017, 4 (04):
  • [23] Direct single electron detection with a CMOS detector for electron microscopy
    Faruqi, AR
    Henderson, R
    Pryddetch, M
    Allport, P
    Evans, A
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2005, 546 (1-2): : 170 - 175
  • [24] Direct and indirect electron microscopy of encapsulated nanocrystals
    Kirkland, AI
    Sloan, J
    TOPICS IN CATALYSIS, 2002, 21 (04) : 139 - 154
  • [25] ELECTRON-MICROSCOPY AFTER DIRECT ULTRACENTRIFUGATION
    JANSONS, J
    HARNETT, GB
    BUCENS, MR
    PATHOLOGY, 1985, 17 (01) : 29 - 30
  • [26] Direct and Indirect Electron Microscopy of Encapsulated Nanocrystals
    Angus I. Kirkland
    Jeremy Sloan
    Topics in Catalysis, 2002, 21 : 139 - 154
  • [27] A NOTE ON DIRECT OBSERVATION OF DISLOCATIONS BY ELECTRON MICROSCOPY
    HASHIMOTO, H
    NAIKI, T
    JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1958, 13 (07) : 764 - 765
  • [28] DIRECT SCANNING ELECTRON MICROSCOPY OF HUMAN SKIN
    PAPA, CM
    FARBER, B
    ARCHIVES OF DERMATOLOGY, 1971, 104 (03) : 262 - &
  • [29] THEORETICAL ASPECTS ON ELECTRON - SOLID INTERACTIONS AND SIGNAL DETECTORS USED IN SCANNING ELECTRON MICROSCOPY
    Munteanu, D.
    Jiman, V.
    Munteanu, S.
    Munteanu, A.
    METALURGIA INTERNATIONAL, 2009, 14 : 153 - 156
  • [30] Electron counting detectors in scanning transmission electron microscopy via hardware signal processing
    Jonathan J. P. Peters
    Tiarnan Mullarkey
    Emma Hedley
    Karin H. Müller
    Alexandra Porter
    Ali Mostaed
    Lewys Jones
    Nature Communications, 14