Numerical modeling of SiC single crystal growth-sublimation and hot-wall epitaxy

被引:11
|
作者
Nishizawa, Shin-ichi [1 ,2 ]
机构
[1] Natl Inst Adv Ind Sci & Technol, Tsukuba, Ibaraki 3058568, Japan
[2] Linkoping Univ, Dept Phys & Measurement Technol, SE-58183 Linkoping, Sweden
关键词
Computer simulation; Heat transfer; Growth from vapor; Single crystal growth; Chemical vapor deposition processes; Semiconducting silicon compounds; CVD;
D O I
10.1016/j.jcrysgro.2008.09.105
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
On the engineering point of view, it is important to develop a design technology of the furnace for SiC single crystal growth. In this point of view, the recent progress of modeling on both sublimation bulk growth and hot-wall epitaxy were presented. For the sublimation, the active control of grown crystal shape by modifying crucible geometry was demonstrated. The effect of nitrogen doping on the heat transfer in a growing crystal were also investigated. For the hot-wall epitaxy, growth rate, surface morphology, and doping concentration could be predicted qualitatively with taking account of the depositing surface conditions. Chlorine-containing system was supposed to provide more stable and uniform process than the common SiH4-based system. (C) 2008 Elsevier B.V. All rights reserved.
引用
收藏
页码:871 / 874
页数:4
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