Current-induced magnetization switching under magnetic field applied along the hard axis in MgO-based magnetic tunnel junctions

被引:13
|
作者
Inokuchi, T. [1 ]
Sugiyama, H.
Saito, Y.
Inomata, K.
机构
[1] Toshiba Co Ltd, Corp R&D Ctr, Kawasaki, Kanagawa 2128582, Japan
[2] Japan Sci & Technol Agcy, CREST, Kawaguchi, Saitama 3320012, Japan
[3] Tohoku Univ, Dept Mat Sci, Grad Sch Engn, Sendai, Miyagi 9808579, Japan
关键词
D O I
10.1063/1.2338016
中图分类号
O59 [应用物理学];
学科分类号
摘要
The authors have investigated the dependence of the critical current density (J(c)) for the current-induced magnetization switching (CIMS) on external magnetic fields applied along the hard axis of a free layer (H-hard) and on the duration of pulse current in MgO-based magnetic tunnel junctions. The J(c) and the intrinsic current density (J(c0)), derived from the dependence of the J(c) on the pulse duration, decreased as parallel to H-hard parallel to increased. These reductions of J(c) and J(c0) would be attributed to the decrease of energy barrier for CIMS and the increase of the spin transfer efficiency. (c) 2006 American Institute of Physics.
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页数:3
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